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Title : | Combined testing approach: Increased efficiency of black box testing | Authors: | Kaprocki, Zvonimir |
Issue Date: | 2015 | Publication: | 2015 IEEE 1st International Workshop on Consumer Electronics (CE WS) | Type: | Conference Paper | DOI: | 10.1109/cews.2015.7867160 | Scopus-ID: | 2-s2.0-85016810734 | URI: | https://enauka.gov.rs/handle/123456789/305285 | Metadata source: | Migrirano iz RIS podataka | M-category: | Mp. category will be shown later |
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