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Physico-Chemical Processes Induced by Electrical Breakdown and Discharge Responsible for Memory Effect in Krypton with < 10 ppm Nitrogen
| Title: | Physico-Chemical Processes Induced by Electrical Breakdown and Discharge Responsible for Memory Effect in Krypton with < 10 ppm Nitrogen | Authors: | Pejović, Milić   ; Pejović, Momčilo M.; Stanković, Koviljka |
Issue Date: | 2017 | Publication: | Plasma Chemistry and Plasma Processing | ISSN: | 0272-4324 Plasma Chemistry and Plasma Processing Search Idenfier |
Type: | Article | Collation: | vol. 38 br. 2 str. 415-428 | DOI: | 10.1007/s11090-017-9870-2 | WoS-ID: | 000425300900009 | Scopus-ID: | 2-s2.0-85039560629 | URI: | https://enauka.gov.rs/handle/123456789/501002 | Metadata source: | Migrirano iz RIS podataka | M-category: | 21M21 |
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