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Study of TiO2 thin films on Si substrate by the photoacoustic elastic bending method
Title: | Study of TiO2 thin films on Si substrate by the photoacoustic elastic bending method | Authors: | Todorović, Dragan ![]() ![]() ![]() ![]() ![]() |
Issue Date: | 2013 | Publication: | Science China Physics, Mechanics and Astronomy | ISSN: | 1674-7348![]() ![]() |
Type: | Article | Collation: | vol. 56 br. 7 str. 1285-1293 | DOI: | 10.1007/s11433-013-5121-6 | WoS-ID: | 000320502800008 | Scopus-ID: | 2-s2.0-84879414326 | URI: | https://enauka.gov.rs/handle/123456789/538468 | Metadata source: | Migrirano iz RIS podataka | M-category: | 22M22 |
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