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Title: Constant voltage stress induced current in Ta2O5 stacks and its dependence on a gate electrode
Authors: Atanassova, E; Stojadinović, Ninoslav D ; Paskaleva, A; Spassov, D; Vračar, Ljubomir M  ; Georgieva, M
Issue Date: 2008
Publication: SEMICONDUCTOR SCIENCE AND TECHNOLOGY
ISSN: 0268-1242 Semiconductor Science and Technology Search Idenfier
Type: Article
Collation: vol. 23 br. 7 str. 75017-75017
DOI: 10.1088/0268-1242/23/7/075017
WoS-ID: 000257201100018
Scopus-ID: 2-s2.0-47749152260
URI: https://enauka.gov.rs/handle/123456789/815920
Metadata source: (Preuzeto iz Nasi u WoS)
M-category: 
21aM21a

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