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Analysis of the processes in power MOSFETs during γ-ray irradiation and subsequent thermal annealing
| Title: | Analysis of the processes in power MOSFETs during γ-ray irradiation and subsequent thermal annealing | Authors: | Jakšić, Aleksandar; Ristić, Goran |
Issue Date: | 1996 | Publication: | Physica Status Solidi (A) Applied Research | ISSN: | 0031-8965 Physica Status Solidi. A: Applications and Materials Science Search Idenfier |
Type: | Article | Collation: | vol. 155 br. 2 str. 371-379 | DOI: | 10.1002/pssa.2211550210 | WoS-ID: | A1996UW34900009 | Scopus-ID: | 2-s2.0-0030172959 | URI: | https://enauka.gov.rs/handle/123456789/881643 | Metadata source: | (Preuzeto iz ORCID-a) Ristić, Goran | M-category: | Mp. category will be shown later |
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