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Browsing by Author Migliori, Alessandro
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| Issue Date | Title | Author(s) | Type | Мp-cat. |
|---|---|---|---|---|
| 2019 | Argon ions deeply implanted in silicon studied by Rutherford/Elastic Backscattering and Grazing Incidence X-ray Fluorescence spectroscopy | Kokkoris, Michael; Androulakaki, Effrossyni G.; Czyzycki, Mateusz; Erich, Marko   ; Karydas, Andreas G.; Leani, Juan J.; Migliori, Alessandro; Ntemou, Eleni; Paneta, Valentina; Petrović, Srđan M. | Konferencijski rad | Mp kategorija će biti prikazana naknadno. |