eNauka - pregled
Pregled prema Autor Emil Jelenković
Prikaz rezultata 1 do 1 od 1
| Godina | Naslov | Autor(i) | Tip rezultata | Mp-kat. |
|---|---|---|---|---|
| 2012 | Positive bias temperature stress in irradiated and non-irradiated thin film transistors (TFTS) | Ristić, Goran   ; Emil Jelenković | Conference Paper | Mp. category will be shown later |