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Browsing by Author M. Denham
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| Issue Date | Title | Author(s) | Type | Мp-cat. |
|---|---|---|---|---|
| 2016 | On-chip I–V variability and random telegraph noise characterization in 28nm CMOS | A. Whitcombe; S. Taylor; M. Denham; Milovanović, Vladimir M.   ; B. Nikolić | Conference Paper | Mp. category will be shown later |