Results 1-20 of 174
Issue DateTitleAuthor(s)TypeМp-cat.
2025Impact of NBTS and Thermal Relaxation on Characteristic of CMOS InverterVeselinović, Nevena; Petrović, Marija; Đorđević, Dunja; Tasić, Lana; Mitrović, Nikola  ; Veljković, Sandra  ; Marjanović, Miloš  ; Živanović, Emilija  ; Davidović, Vojkan  ; Danković, Danijel  Conference Paper
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2025Recovery Behavior of VDMOS Transistors under Sequential Irradiation and NBT StressĐorić-Veljković, Snežana  ; Živanović, Emilija  ; Davidović, Vojkan  ; Veljković, Sandra  ; Mitrović, Nikola  ; Ristić, Goran  ; Paskaleva, Albena; Spassov, Dencho; Danković, Danijel  Contribution to periodical
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2025A Method for Automatic Characterization and Measurement of Ceramic Materials Using Virtual InstrumentationĐorđević, Miloš  ; Paunović, Vesna  ; Danković, Danijel  Article
23M23
2025The SPICE Modeling of a Radiation Sensor Based on a MOSFET with a Dielectric HfO2/SiO2 Double-LayerMarjanović, Miloš  ; Ilić, Stefan  ; Veljković, Sandra  ; Mitrović, Nikola  ; Umutcan Gurer; Ozan Yilmaz; Aysegul Kahraman; Aliekber Aktag; Huseyin Karacali; Erhan Budak;
Danković, Danijel  ; Ristić, Goran  ; Ercan Yilmaz;
Article
21M21
2025Characterization of RADFETs as Radiation Sensors for Telecommunication Satellite ApplicationsMarjanović, Miloš  ; Ilić, Stefan  ; Miljković, Sandra; Veljković, Sandra  ; Danković, Danijel  ; Yilmaz, Ercan; Ristić, Goran  Conference Paper
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2025Investigation of NBTI and Relaxation Effects in P-Channel Power VDMOS TransistorsPetrović, Marija; Veselinović, Nevena; Tasić, Lana; Đorđević, Dunja; Veljković, Sandra  ; Mitrović, Nikola  ; Marjanović, Miloš  ; Živanović, Emilija  ; Danković, Danijel  Conference Paper
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2025IEEE Electron Devices Society/SSCS Serbia and Montenegro Joint Chapter’s Role in Promoting Science and Engineering [Chapters]Veljković, Sandra  ; Živanović, Emilija  ; Marjanović, Miloš  ; Mitrović, Nikola  ; Danković, Danijel  Article
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2025Proposal of Dual-Gate Oxide Layered with HfO2: Comparative Results with SiO2-RadFETYilmaz, Ercan; Ristić, Goran  ; Turan, Rasit; Yilmaz, Ozan; Gurer, Umutcan; Danković, Danijel  ; Budak, Erhan; Marjanović, Miloš  ; Veljković, Sandra  ; Mutale, Alex;
Kahraman, Aysegul;
Article
21aM21a
2025IEEESTEC 18th Student Projects Conference [November 27, 2025, Niš, Serbia]. Proceedings of Papers. Organized by EESTEC LC Niš, IEEE Student Branch Niš, Faculty of Electronic Engineering Niš.Marković, Vera  ; Danković, Danijel  ; Marinković, Zlatica  ; Marjanović, Miloš  ; Stošić, Biljana  ; Živanović, Emilija  Editorial works
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2025Impact of Bias Temperature Stress, Irradiation and Self-Heating Effects on p-Channel Power VDMOS TransistorsVeljković, Sandra  ; Mitrović, Nikola  ; Marjanović, Miloš  ; Živanović, Emilija  ; Davidović, Vojkan  ; Ristić, Goran  ; Danković, Danijel  Contribution to periodical
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2025Is Reliability of Electronic Components Understandable to High School Students? A Workshop-Based Insight from the RESIST ProjectVeljkovic, Sandra  ; Mitrović, Nikola  ; Marjanović, Miloš  ; Živanović, Emilija  ; Davidović, Vojkan  ; Ristić, Goran  ; Danković, Danijel  Contribution to periodical
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2025Investigation of the Self-Heating Effect in a P-Channel VDMOS Transistor After NBT Stress and RelaxationĐorđević, Dunja; Tasić, Lana; Veselinović, Nevena; Petrović, Marija; Veljković, Sandra  ; Mitrović, Nikola  ; Marjanović, Miloš  ; Živanović, Emilija  ; Ristić, Goran  ; Danković, Danijel  Conference Paper
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2025Experimental and SPICE-Based Modeling of NBTI and SHE in Power P-Channel VDMOS TransistorsTasić, Lana; Veselinović, Nevena; Petrović, Marija; Đorđević, Dunja; Marjanović, Miloš  ; Davidović, Vojkan  ; Veljković, Sandra  ; Mitrović, Nikola  ; Živanović, Emilija  ; Danković, Danijel  Conference Paper
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2025Influence of Magnetic Field on Commercial P-Channel VDMOSFETsMitrović, Nikola  ; Veljkovic, Sandra  ; Marjanović, Miloš  ; Živanović, Emilija  ; Davidović, Vojkan  ; Ristić, Goran  ; Danković, Danijel  Contribution to periodical
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2025Examination of TinyML Approach in ESP32-Based NFC ApplicationsMitrović, Nikola  ; Veljković, Sandra  ; Marjanović, Miloš  ; Živanović, Emilija  ; Andjelković, Marko ; Ristić, Goran  ; Danković, Danijel  Conference Paper
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2024Impact of Trapped Charge on the Breakdown Phenomena in HfO2/Al2O3 — Based Memory CapacitorsSpassov, D.; Paskaleva, A.; Guziewicz, E.; Ivanov, Tz.; Stanchev, T.; Davidović, Vojkan  ; Veljković, Sandra  ; Mitrović, Nikola  ; Danković, Danijel  Article
22M22
2024Assessment of NBT Stressing Impact on the Continuous Operation of Power VDMOS TransistorVeljković, Sandra  ; Mitrović, Nikola  ; Živanović, Emilija  ; Marjanović, Miloš  ; Davidović, Vojkan  ; Ristić, Goran  ; Danković, Danijel  Conference Paper
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2024IEEESTEC 17th Student Projects Conference [November 28, 2024, Niš, Serbia]. Proceedings of Papers.Marković, Vera  ; Danković, Danijel  ; Marinković, Zlatica  ; Marjanović, Miloš  ; Stošić, Biljana  ; Živanović, Emilija  Editorial works
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2024The effects of NBT stressing on later operation of power VDMOS transistors under normal conditionsVeljkovic, Sandra  ; Mitrović, Nikola  ; Davidović, Vojkan  ; Albena Paskaleva; Dencho Spassov; Jovanović, Igor  ; Živanović, Emilija  ; Ristić, Goran  ; Danković, Danijel  Conference Paper
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2024Thermal annealing induced recovery of the VT of irradiated commercial MOS transistorsMitrović, Nikola  ; Guirado, Damian; Danković, Danijel  ; Palma, Alberto; Ristić, Goran  ; Carvajal, MiguelArticle
22M22