Претрага
Резултати
The influence of ion bombardment intensity during deposition on nickel films microstructure [1999]
Popovic, N; Bogdanov, ŽarkoOptical and electrical properties of gallium doped indium tin oxide optimized for low deposition temperature applications
[2017]
Campa, Andrej; Berginc, Marko; Vojisavljević, Katarina Characteristics of large area silicon surface barrier detectors [1997]
Stojanović, Milan; Osmokrovic, PTEA CO2 laser-induced damage of low-thickness TiN coatings [1999]
Gaković, Biljana M.Effect of precursor solution on the formation of perovskite phase of Pb(Mg-1/Nb-3(2/3))O-3 thin films [2002]
Spagnol, PD; Varela, JA; Bertochi, MAZ; Stojanovic, Biljana D; Tebcherani, SMNoise and structural properties of reactively sputtered RuO2 thin films [2006]
Jevtic, Milan M; Jelenkovic, Emil V; Tong, KY; Pang, GKHCrystallographic characteristics and fine structures of semiconducting transition metal silicides [2011]
Shao, G.; Gao, Y.; Xia, X. H.; Milosavljević, MomirThe effect of rapid thermal annealing on structural and electrical properties of TiB2 thin films [1997]
Todorović, Bratislav; Jokic, T; Rakočević, Zlatko Lj.Microstructural modification of TiN deposited by magnetron ion plating: Influence of magnetic field configuration [1998]
Zlatanovic, M; Popovic, N; Bogdanov, ŽarkoApplication of level set method in simulation of surface roughness in nanotechnologies [2009]
Radmilovic-Radjenovic, Marija DФилтери
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