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Browsing by Author Liarokapis, E.
Showing results 1 to 3 of 3
| Issue Date | Title | Author(s) | Type | Мp-cat. |
|---|---|---|---|---|
| 2013 | Micro-Raman depth profiling of silicon amorphization induced by high-energy ion channeling implantation | Erich, Marko   ; Petrović, Srđan M. ; Kokkoris, Michael; Liarokapis, E.; Antonakos, A.; Telečki, Igor N. | Article | 21M21 |
| 2014 | Probing high-energy ion-implanted silicon by micro-Raman spectroscopy | Kopsalis, I. ; Paneta, Valentina; Kokkoris, Michael; Liarokapis, E.; Erich, Marko ; Petrović, Srđan M. ; Fazinic, S.; Tadić, Tonči | Article | 21M21 |
| 2021 | The quantitative 6H-SiC crystal damage depth profiling | Gloginjić, Marko ; Erich, Marko ; Kokkoris, Michael; Liarokapis, E.; Fazinić, Stjepko; Karlušić, Marko; Tomić Luketić, Kristina; Petrović, Srđan M. | Article | 21aM21a |