eNauka - pregled
Pregled prema Autor AV Antanovich
Prikaz rezultata 1 do 1 od 1
| Godina | Naslov | Autor(i) | Tip rezultata | Mp-kat. |
|---|---|---|---|---|
| 2019 | Point-by-point inversion vs. parametrized fitting of ultrathin films dielectric function measured by rotating polarizer ellipsometry | Jakovljević, Milka M. | Conference Paper | Mp. category will be shown later |