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Browsing by Author Glavanovics, M
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| Issue Date | Title | Author(s) | Type | Мp-cat. |
|---|---|---|---|---|
| 2008 | The study of ESD induced defects in smart power ESD protection circuits using low frequency noise measurements | Hadzi-Vukovic, Jovan M; Jevtic, Milan M; Glavanovics, M; Rothleitner, H | Conference Paper | Mp. category will be shown later |