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Browsing by Author Moutinho, A. M. C.
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| Issue Date | Title | Author(s) | Type | Мp-cat. |
|---|---|---|---|---|
| 2013 | Influence of the patch field on work function measurements based on the secondary electron emission | Bundaleski, Nenad   ; Trigueiro, J.; Silva, A. G.; Moutinho, A. M. C.; Teodoro, O. M. N. D. | Article | 21M21 |
| 2011 | Novel approach to the semi-empirical universal theory for secondary electron yield | Bundaleski, Nenad ; Shaw, B. J.; Silva, A. G.; Moutinho, A. M. C.; Teodoro, O. M. N. D. | Article | 22M22 |