eNauka - pregled
Pregled prema Projekat IMA GmbH
Prikaz rezultata 1 do 2 od 2
| Godina | Naslov | Autor(i) | Tip rezultata | Mp-kat. |
|---|---|---|---|---|
| 2008 | Non-contact measurement of thickness uniformity of chemically etched Si membranes by fiber-optic low-coherence interferometry | Đinović, Zoran  ; Tomić, Miloš  ; Manojlović, Lazo ; Lazić, Žarko ; Smiljanić, Milče M. | Book parts | Mp. category will be shown later |
| 2008 | Non-contact measurement of thickness uniformity of chemically etched Si membranes by fiber-optic low-coherence interferometry | Đinović, Zoran ; Tomić, Miloš ; Manojlović, Lazo ; Lazić, Žarko ; Smiljanić, Milče | Conference Paper | Mp. category will be shown later |