Researchers
Vračar, Ljubomir
Results 61-67 of 67
| Issue Date | Title | Author(s) | Type | Мp-cat. |
|---|---|---|---|---|
| 2008 | Constant voltage stress induced current in Ta2O5 stacks and its dependence on a gate electrode | Atanassova, E; Stojadinović, Ninoslav D  ; Paskaleva, A; Spassov, D; Vračar, Ljubomir M  ; Georgieva, M | Article | 21aM21a |
| 2005 | Comparative potentiodynamic study of nickel and hydrogen underpotential deposition at polycrystalline platinum electrode in weak acid and neutral solutions | Obradović, Maja ; Grgur, Branimir ; Vračar, Ljiljana M. | Article | 22M22 |
| 2005 | Computer as powerful tool in reliability testing of thin gate dielectrics in MOS devices | Vračar, Ljubomir ; Pešić, Biljana ; Stojadinović, Ninoslav | Conference Paper | Mp. category will be shown later |
| 2005 | Microstructure evolution and ferroelectric domains in Nb2O5 and CaZrO3 doped BaTiO3 | Mitić, Vojislav ; Živković, Ljiljana ; Paunović, Vesna ; Vračar, Ljubomir ; Miljković, Miroslav | Conference Paper | Mp. category will be shown later |
| 2005 | The synergistic effects of Nb/Mn and Sb/Mn on the microstructure and electrical characteristics of BaTiO3 based ceramics | Živković, Ljiljana ; Mitić, Vojislav ; Paunović, Vesna ; Vračar, Ljubomir ; Stojanović, B; Peron, K.; Zagete, M. | Conference Paper | Mp. category will be shown later |
| 2003 | Computer controlled equipment for laboratory exercises in physics and electronics | Vračar, Ljubomir ; Stojadinović, Ninoslav ; Acković, B; Jovanović, S | Conference Paper | Mp. category will be shown later |
| 2003 | Stress-induced leakage currents in thin silicon dioxide films | Pesić, Biljana ; Vračar, Ljubomir M ; Stojadinović, Ninoslav D ; Pecovska-Đorđević, M; Novkovski, N | Article | 22M22 |