Istraživači



Results 41-60 of 83
Issue DateTitleAuthor(s)TypeМp-cat.
2014Kinetics of positive ions and electrically neutral active particles in afterglow in neon at low pressurePejović, Milić  ; Nešić, Nikola ; Pejović, Momčilo Article
21M21
2014Electrical breakdown time delay in nitrogen filled tube with small inter electrode gapPejović, Milić  ; Nesic, Nikola T.; Pejović, Momčilo Article
22M22
2013The gamma-ray irradiation sensitivity and dosimetric information instabiliti of RADFETPejović, Milić  Article
22M22
2013Radiation Damage in Electronic Memory DevicesFetahović, Irfan  ; Pejović, Milić  ; Vujisić, Miloš  Article
21aM21a
2013Sensitivity of P-Channel MOSFET to X- and Gamma-Ray IrradiationPejović, Milić M.  ; Ciraj-Bjelac, Olivera  ; Kovačević, Milojko; Rajović, Zoran; Ilić, GvozdenArticle
21aM21a
2013Erratum: Sensitivity of P-Channel MOSFET to X- and Gamma-Ray Irradiation (Vol. 33, pg. 1-23, 2013)Pejović, Milić M.  ; Ciraj-Bjelac, Olivera  ; Kovačević, Milojko; Rajović, Zoran; Ilić, GvozdenOther
Mp. category will be shown later
2013Investigation of Memory Effect by Measurement of Time Delay of Electrical Breakdown in Commercial Gas-filled Surge ArrestersPejović, Momčilo ; Nikola Nešić ; Pejović, Milić  ; Natasa Nesic Conference Paper
Mp. category will be shown later
2013Effects of Ion Beam Irradiation on Nanoscale InOx Cooper-Pair InsulatorsMilosavljevic, Srdjan ; Lazarević, Đorđe R.  ; Stanković, Koviljka  ; Pejović, Milić M.  ; Vujisić, Miloš Lj.  Article
21aM21a
2013RADFET as a sensor and dosimeter of gamma-ray - irradiationPejović, Milić  ; Pejović, Momčilo ; Nešić, Nikola Conference Paper
Mp. category will be shown later
2013Processes in afterglow responsible for initiation of electrical breakdown in xenon at low pressurePejović, Momčilo ; Spasić, Ivana; Pejović, Milić  ; Nešić, Nikola ; Brajović, Dragan  Article
22M22
2013Response of pMOS dosemeters on gamma-ray irradiation during its re-usePejović, Milić  ; Pejović, Momčilo ; Jaksic, A. B.Article
22M22
2013Radiation Hardness of Flash Memory Fabricated in Deep-Submicron TechnologyCavrić, Bojan; Dolićanin, Edin  ; Petronijević, Predrag  ; Pejović, Milić  ; Stanković, Koviljka  Article
21aM21a
2012Investigation of breakdown voltage and electrical breakdown time delay in air-filled tube in presence of combined gas and vacuum breakdown mechanismPejović, Momčilo ; Živanović, Emilija  ; Pejović, Milić  ; Nešić, Nikola T. ; Kovačević, Dragan  Article
22M22
2012Influence of Ionizing Radiation and Hot Carrier Injection on Metal-Oxide-Semiconductor Transistors, Chapter in monoraphy Current Topics in Ionizing, Radiation Research, edited by M. NenoiPejović, Momčilo ; Osmokrović, Predrag ; Pejović, Milić  ; Stanković, Koviljka  Book parts
Mp. category will be shown later
2012Afterglow processes responsible for memory effect in nitrogenPejović, Milić  ; Nešić, N. T.; Pejović, Momčilo ; Živanović, Emilija  Article
21M21
2012Delay Response of Gas Discharge TubesPejović, Milić  ; Pejović, Momčilo ; Marić R.; Timotijević Lj.; Stanković K.  Conference Paper
Mp. category will be shown later
2012Contribution of fixed oxide traps to sensitivity of pMOS dosimeters during gamma ray irradiation and annealing at room and elevated temperaturePejović, Milić  ; Pejović, Momčilo ; Jaksic, Aleksandar B.Naučni članak
21M21 - Vodeći međunarodni časopis kategorije M21
2012Delay Response of Gas Discharge Tubes, Progress In Electromagnetics Research Symposium, PIERS 2012Pejović, Milić  ; Pejović, Momčilo ; Stanković, Koviljka  ; R. Marić; Lj. TimotijevićKonferencijski rad
Mp kategorija će biti prikazana naknadno.
2012Investigation of post-discharge processes in nitrogen at low pressurePejović, Momčilo ; Nikola Nešić; Pejović, Milić  ; D. Brajovic  ; I. DenićNaučni članak
21M21 - Vodeći međunarodni časopis kategorije M21
2011The influence of additional electrons on memory effect in nitrogen at low pressuresNesic, Nikola T; Pejović, Momčilo ; Pejović, Milić  ; Živanović, Emilija  Naučni članak
21M21 - Vodeći međunarodni časopis kategorije M21