Претрага




Резултати

The effect of a localized deformation upon the common-emitter transistor current gain   [1971]

Đurić, Zoran G. 

A simple boundary condition at semiconductor-insulating substrate interface of a TFT   [1977]

Smiljanić, Miloljub

Modelling of strained-Si/SiGe NMOS transistors including DC self-heating   [2006]

Jankovic, Nebojsa D; Pesic, Tatjana V; O'Neill, AG

Self consistent fitting method for defect analysis by low-frequency noise measurements in reverse biased p-n junctions   [1997]

Jevtic, MM; Lazovic, MV

A proposal for use of "Tandel" to obtain optimal temperature of electro-optical devices   [1966]

Bugarinović, Đ.D.

Creation and passivation of interface traps in irradiated MOS transistors during annealing at different temperatures   [1997]

Pejović, Momčilo ; Ristić, Goran  

Carrier recombination processes in MOVPE and MBE grown 1.3 μm GaInNAs edge emitting lasers   [2003]

Fehse, R.; Adams, A.R.; Sweeney, S.J.; Tomic, Stanko  ; Riechert, H.; Ramakrishnan, A.

All injection level power PiN diode model including temperature dependence   [2007]

Jankovic, Nebojsa D; Pesic, Tatjana V; Igic, Petar

Fowler-Nordheim high electric field stress of power VDMOSFETs   [2005]

Ristic, Goran S  ; Pejovic, Momcilo M; Jaksic, Aleksandar B

Annealing of gamma-irradiated Al-gate NMOS transistors   [1994]

Pejović, Momčilo ; Golubović, Snežana ; Ristić, Goran  ; Odalović, Milan

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