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Negative Bias Temperature Instability in Thick Gate Oxides for Power MOS Transistors
[2014]
Stojadinović, Ninoslav
; Manić, Ivica
; Danković, Danijel
; Đorić-Veljković, Snežana
; Davidović, Vojkan
; Prijić, Aneta
; Golubović, Snežana
; Prijić, Zoran
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