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Negative Bias Temperature Instability in p-Channel Power VDMOSFETs Under Pulsed Bias Stress
[2010]
Manić, Ivica 
; Danković, Danijel ; Đorić-Veljković, Snežana ; Prijić, Aneta ; Davidović, Vojkan ; Golubović, Snežana ; Prijić, Zoran ; Stojadinović, Ninoslav
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