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Резултати
Influence of the Charge State of Xenon Ions on the Depth Distribution Profile Upon Implantation into Silicon [2019]
Balakshin, Yu. V.; Kozhemiako, A. V.; Petrović, Srđan M.Synthesis of Nanostructured CuO Film by an Amalgamation of Sol-gel and Screen-printing using Copper (II) Acetate as Precursor [2026]
Kumar, Vipin; Agrwal, Akansha; Kumar, Parvin; Yadav, NP; Gupta, Monika; Kumar, Pradeep; Zargar, RA; Dwivedi, DKStructure of DX-like centers in narrow-band IV–VI semiconductors doped with group-III elements
[1998]
Ivanchik, I.I.; Khokhlov, D.R.; Belogorokhov, A.I.; Popović, Z.; Romćević, N. Filteri
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