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Research outputs

Influence of the Charge State of Xenon Ions on the Depth Distribution Profile Upon Implantation into Silicon   [2019]

Balakshin, Yu. V.; Kozhemiako, A. V.; Petrović, Srđan M.  ; Erich, Marko  ; Shemukhin, Andrey A.; Chernysh, Vladimir S.

Structure of DX-like centers in narrow-band IV–VI semiconductors doped with group-III elements   [1998]

Ivanchik, I.I.; Khokhlov, D.R.; Belogorokhov, A.I.; Popović, Z.; Romćević, N.  

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