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Defect Behaviors During High Electric Field Stress of p-Channel Power MOSFETs [2012]
Ristić, Goran
Modeling of NBTS Effects in P-Channel Power VDMOSFETs
[2020]
Danković, Danijel ; Mitrović, Nikola ; Prijić, Zoran ; Stojadinović, Ninoslav D.
On the Recoverable and Permanent Components of NBTI in p-Channel Power VDMOSFETs [2016]
Danković, Danijel ; Manić, Ivica ; Davidović, Vojkan ; Prijić, Aneta ; Marjanović, Miloš ; Ilic, Aleksandar; Prijić, Zoran ; Stojadinović, Ninoslav
Integer Codes Correcting Single Errors and Detecting Burst Errors Within a Byte [2020]
Radonjić, Aleksandar
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