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Research outputs

Modeling of NBTS Effects in P-Channel Power VDMOSFETs   [2020]

Danković, Danijel  ; Mitrović, Nikola  ; Prijić, Zoran  ; Stojadinović, Ninoslav D. 

On the Recoverable and Permanent Components of NBTI in p-Channel Power VDMOSFETs   [2016]

Danković, Danijel  ; Manić, Ivica  ; Davidović, Vojkan  ; Prijić, Aneta  ; Marjanović, Miloš  ; Ilic, Aleksandar; Prijić, Zoran  ; Stojadinović, Ninoslav 

Defect Behaviors During High Electric Field Stress of p-Channel Power MOSFETs   [2012]

Ristić, Goran  

Integer Codes Correcting Single Errors and Detecting Burst Errors Within a Byte   [2020]

Radonjić, Aleksandar  

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