Applied Modified Metaheuristic: Machine Learning Tuned for Software Defect Detection, Chapter in CCIS Communications in Computer and Information Science: ASCIS 2025: Artificial Intelligence Based Smart and Secured Applications, Springer, volume 2820

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Title:	Applied Modified Metaheuristic: Machine Learning Tuned for Software Defect Detection, Chapter in CCIS Communications in Computer and Information Science: ASCIS 2025: Artificial Intelligence Based Smart and Secured Applications, Springer, volume 2820
Authors:	N. Bacanin ; V. Kostic; R. Dragic; L. Jovanovic ; M. Zivkovic ; B. Radomirovic; V. Zeljkovic; P. Spalevic; D. Kavitha
Issue Date:	2026
Publication:	CCIS Communications in Computer and Information Science: ASCIS 2025: Proceedings of International Conference on Advancements in Smart Computing and Information Security, volume 2820
ISSN:	1865-0929 Search Idenfier
Publisher:	Springer, Cham
Type:	Book parts
Collation:	str. 120-130
DOI:	10.1007/978-3-032-17837-4_8
URI:	http://ezaposleni.singidunum.ac.rs/rest/sciNaucniRezultati/oai/record/3/11855 https://link.springer.com/chapter/10.1007/978-3-032-17837-4_8 https://enauka.gov.rs/handle/123456789/1030304
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