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Influence of controlling signal parameters and prior stresses on the self-heating of VDMOS power transistors
| Naziv: | Influence of controlling signal parameters and prior stresses on the self-heating of VDMOS power transistors | Autori: | Veljkovic, S; Mitrovic, N; Davidovic, Vojkan S   ; Paskaleva, Albena; Spassov, Dencho; Marjanovic, M; Zivanovic, Emilija N; Ristic, G; Dankovic, Danijel M |
Godina: | 2026 | Publikacija: | MICROELECTRONICS RELIABILITY | ISSN: | 0026-2714 Microelectronics Reliability Pretraži identifikator |
Tip rezultata: | Naučni članak | Kolacija: | vol. 181 str. 116151-116151 | DOI: | 10.1016/j.microrel.2026.116151 | WoS-ID: | 001756031700001 | Scopus-ID: | 2-s2.0-105036174140 | URI: | https://enauka.gov.rs/handle/123456789/1038434 | Projekat: | Ministry of Science, Technological Development and Innovation of the Republic of Serbia [451-03-137/2025-03/200102] Horizon Europe Twinning project AIDA4Edge [101160293] UK Research and Innovation organisation |
Izvor metapodataka: | (Preuzeto iz Nasi u WoS) | M-kategorija: | 22M22 - Međunarodni časopis kategorije M22 |
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