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Nanoscale topography of GC/Pt-C and GC/Pt-Ru-C electrodes studied by means of STM, AFM and XRD methods
| Naziv: | Nanoscale topography of GC/Pt-C and GC/Pt-Ru-C electrodes studied by means of STM, AFM and XRD methods | Autori: | Kowal, Andrzej; Olszewski, Piotr K.; Tripković, Dušan |
Godina: | 2006 | Publikacija: | Materials Science Forum | ISSN: | 0255-5476 Materials Science Forum Pretraži identifikator |
Tip rezultata: | Konferencijski rad | Kolacija: | vol. 518 str. 271-276 | DOI: | 10.4028/www.scientific.net/MSF.518.271 | WoS-ID: | 000239351800045 | Scopus-ID: | 2-s2.0-37849022051 | URI: | https://cer.ihtm.bg.ac.rs/handle/123456789/281 https://enauka.gov.rs/handle/123456789/134326 |
M-kategorija: | Mp kategorija će biti prikazana naknadno. |
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