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Neural networks and microelectronics parameters distribution measurements depending on sintering temperature and applied voltage
| Title: | Neural networks and microelectronics parameters distribution measurements depending on sintering temperature and applied voltage | Authors: | Mitić, Vojislav V.; Ribar, Srđan |
Issue Date: | 2020 | Publication: | Modern Physics Letters B | ISSN: | 0217-9849 Modern Physics Letters B Search Idenfier |
Publisher: | World Scientific | Type: | Article | Collation: | vol. 34 br. 35 str. 2150172-2150172 | DOI: | 10.1142/S0217984921501724 | WoS-ID: | 000603067600014 | Scopus-ID: | 2-s2.0-85098142433 | URI: | https://machinery.mas.bg.ac.rs/handle/123456789/3351 https://enauka.gov.rs/handle/123456789/181690 https://vinar.vin.bg.ac.rs/handle/123456789/9792 https://cer.ihtm.bg.ac.rs/handle/123456789/4242 |
M-category: | 22M22 |
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