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| Title: | Simulated exposure of titanium dioxide memristors to ion beams | Authors: | Marjanovic, Nada; Vujisić, Miloš   ; Stanković, Koviljka ; Despotović, Dejan ; Osmokrović, Predrag |
Issue Date: | 2010 | Publication: | Nuclear Technology & Radiation Protection | ISSN: | 1451-3994 Nuclear technology and radiation protection Search Idenfier |
Publisher: | Belgrade : VINČA Institute of Nuclear Sciences | Type: | Article | Collation: | vol. 25 br. 2 str. 120-125 | DOI: | 10.2298/ntrp1002120m | WoS-ID: | 000282478100008 | Scopus-ID: | 2-s2.0-78649726446 | VBS COBISS: | 512209060 | URI: | https://enauka.gov.rs/handle/123456789/187205 https://plus.cobiss.net/cobiss/sr/sr/bib/512209060#izum.si http://zaposleni.etf.bg.ac.rs/rest/sciNaucniRezultati/oai/record/2/575002 |
Metadata source: | Migracija | M-category: | 22M22 |
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