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Spectroscopic imaging ellipsometry for automated search of flakes of mono- and n-layers of 2D-materials
| Title: | Spectroscopic imaging ellipsometry for automated search of flakes of mono- and n-layers of 2D-materials | Authors: | Funke, S.; Wurstbauer, U.; Miller, B.; Matković, Aleksandar |
Issue Date: | 2017 | Publication: | Applied Surface Science | ISSN: | 0169-4332 Applied Surface Science Search Idenfier |
Type: | Article | Collation: | vol. 421 str. 435-439 | DOI: | 10.1016/j.apsusc.2016.10.158 | WoS-ID: | 000408756700027 | Scopus-ID: | 2-s2.0-85006741982 | URI: | https://enauka.gov.rs/handle/123456789/196043 | Metadata source: | Migrirano iz RIS podataka | M-category: | 21aM21a |
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