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TID and NIEL Assessment in Alpha Irradiated Phase Change Memory Cells Based on Simulations
| Title: | TID and NIEL Assessment in Alpha Irradiated Phase Change Memory Cells Based on Simulations | Authors: | Vujisić, Miloš   ; Zdjelarevic Nevena S. |
Issue Date: | 2015 | Publication: | JOURNAL OF OVONIC RESEARCH | ISSN: | 1842-2403 Journal of Ovonic Research Search Idenfier |
Publisher: | National Institute of Research and Development for Optoelectronics Romania | Type: | Article | Collation: | vol. 11 br. 4 str. 175-182 | WoS-ID: | 000360156200003 | URI: | http://zaposleni.etf.bg.ac.rs/rest/sciNaucniRezultati/oai/record/2/706748 https://enauka.gov.rs/handle/123456789/222258 |
Metadata source: | Migracija | M-category: | 23M23 |
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