Rezultati
| Title: | On the Recoverable and Permanent Components of NBTI in p-Channel Power VDMOSFETs | Authors: | Danković, Danijel |
Issue Date: | 2016 | Publication: | IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY | ISSN: | 1530-4388 IEEE Transactions on Device and Materials Reliability Search Idenfier |
Type: | Article | Collation: | vol. 16 br. 4 str. 522-531 | DOI: | 10.1109/tdmr.2016.2598557 | WoS-ID: | 000389852400016 | Scopus-ID: | 2-s2.0-85003823222 | URI: | https://enauka.gov.rs/handle/123456789/226559 | Project: | Ministry of Education, Science and Technological Development of the Republic of Serbia [OI-171026, TR-32026] Ei PCB Factory, Nis, Serbia |
Metadata source: | Migracija | M-category: | 21M21 |
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