Modeling and investigation of SiGe based MOSFET structure transport characteristics

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Naziv:	Modeling and investigation of SiGe based MOSFET structure transport characteristics
Autori:	Lukić, Petar M. ; Ramović, Rifat; Šašić, Rajko
Godina:	2007
Publikacija:	Konferencija Društva za ispitivanje materijala (8 : 2006 : Herceg Novi). - Research Trends in Contemporary Materials Science. - Zurich : Trans Tech Publications, 2007. - ISBN 0878494413
ISSN:	0255-5476 Materials Science Forum Pretraži identifikator
Tip rezultata:	Konferencijski rad
Kolacija:	str. 101-106
DOI:	10.4028/0-87849-441-3.101
WoS-ID:	000249653700015
Scopus-ID:	2-s2.0-38349065190
VBS COBISS:	32245263
URI:	https://plus.cobiss.net/cobiss/sr/sr/bib/32245263#izum.si http://vbs.rs/scripts/cobiss?command=DISPLAY&base=70036&RID=32245263 https://machinery.mas.bg.ac.rs/handle/123456789/680 http://TechnoRep.tmf.bg.ac.rs/handle/123456789/1008 https://enauka.gov.rs/handle/123456789/233480
M-kategorija:	Mp kategorija će biti prikazana naknadno.

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