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| Title: | Permittivity Characterization Using a Double-Sided Parallel-Strip Line Resonator | Authors: | Nešić, Dušan   ; Radnović, Ivana |
Issue Date: | 2018 | Publication: | Proceedings of the International Semiconductor Conference, CAS | ISSN: | 1545-827X  Search Idenfier |
Publisher: | Institute of Electrical and Electronics Engineers Inc. | Type: | Conference Paper | Collation: | str. 109-112 | DOI: | 10.1109/SMICND.2018.8539801 | WoS-ID: | 000514386700019 | Scopus-ID: | 2-s2.0-85059646775 | URI: | https://cer.ihtm.bg.ac.rs/handle/123456789/2397 https://www.imt.ro/CAS/ https://enauka.gov.rs/handle/123456789/241231 |
URL: | https://www.imt.ro/CAS/ | Project: | Mikro, nano-sistemi i senzori za primenu u elektroprivredi, procesnoj industriji i zaštiti životne sredine (RS-32008) | M-category: | Mp. category will be shown later |
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