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Reliability of Semiconductor and Gas-Filled Diodes for Over-Voltage Protection Exposed to Ionizing Radiation
| Naziv: | Reliability of Semiconductor and Gas-Filled Diodes for Over-Voltage Protection Exposed to Ionizing Radiation | Autori: | Stanković, Koviljka   ; Vujisić, Miloš Lj. ; Dolicanin, Edin |
Godina: | 2009 | Publikacija: | Nuclear technology and radiation protection | ISSN: | 1451-3994 Nuclear technology and radiation protection Pretraži identifikator |
Tip rezultata: | Naučni članak | Kolacija: | vol. 24 br. 2 str. 132-137 | DOI: | 10.2298/NTRP0902132S | WoS-ID: | 000270413200010 | Scopus-ID: | 2-s2.0-70649096063 | URI: | https://vinar.vin.bg.ac.rs/handle/123456789/3251 http://zaposleni.etf.bg.ac.rs/rest/sciNaucniRezultati/oai/record/2/575005 https://plus.cobiss.net/cobiss/sr/sr/bib/197064460#izum.si https://enauka.gov.rs/handle/123456789/244199 |
Projekat: | Ministry of Science and Technological Development of the Republic of Serbia [141046] | M-kategorija: | 23M23 - Rad u međ. časopisu |
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