Reliability of Semiconductor and Gas-Filled Diodes for Over-Voltage Protection Exposed to Ionizing Radiation

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Naziv:	Reliability of Semiconductor and Gas-Filled Diodes for Over-Voltage Protection Exposed to Ionizing Radiation
Autori:	Stanković, Koviljka ; Vujisić, Miloš Lj. ; Dolicanin, Edin
Godina:	2009
Publikacija:	Nuclear technology and radiation protection
ISSN:	1451-3994 Nuclear technology and radiation protection Pretraži identifikator
Tip rezultata:	Naučni članak
Kolacija:	vol. 24 br. 2 str. 132-137
DOI:	10.2298/NTRP0902132S
WoS-ID:	000270413200010
Scopus-ID:	2-s2.0-70649096063
URI:	https://vinar.vin.bg.ac.rs/handle/123456789/3251 http://zaposleni.etf.bg.ac.rs/rest/sciNaucniRezultati/oai/record/2/575005 https://plus.cobiss.net/cobiss/sr/sr/bib/197064460#izum.si https://enauka.gov.rs/handle/123456789/244199
Projekat:	Ministry of Science and Technological Development of the Republic of Serbia [141046]
M-kategorija:	23M23 - Međunarodni časopis kategorije M23

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