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Positive bias temperature stress in irradiated and non-irradiated thin film transistors (TFTS)
| Title: | Positive bias temperature stress in irradiated and non-irradiated thin film transistors (TFTS) | Authors: | Ristić, Goran   ; Emil Jelenković |
Issue Date: | 2012 | Publication: | The First International Conference on Radiation and Dosimetery in Various Fields of Researh (RAD 2012) | Publisher: | Srbija | Type: | Conference Paper | ISBN: | 978-86-6125-063-7  Search Idenfier |
Collation: | vol. 1 br. 1 str. 79-80 | URI: | https://enauka.gov.rs/handle/123456789/250419 | URL: | https://www.rad2012.elfak.rs | Metadata source: | Migrirano iz RIS podataka | M-category: | Mp. category will be shown later |
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