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Investigation of dielectric-Semiconductor Interface in MIS Structures Based on p-Hg0.8Cd0.2Te
| Title: | Investigation of dielectric-Semiconductor Interface in MIS Structures Based on p-Hg0.8Cd0.2Te | Authors: | Damnjanović, Vesna |
Issue Date: | 2010 | Publication: | Proceedings of the 27th International Conference on microelectronics MIEL 2010 | Publisher: | ISEE Electron Devices Society, Srbija | Type: | Conference Paper | ISBN: | 978-1-4244-7198-0 Search Idenfier |
Collation: | str. 131-134 | URI: | https://enauka.gov.rs/handle/123456789/256037 | URL: | http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5483038 | Metadata source: | Migrirano iz RIS podataka | M-category: | Mp. category will be shown later |
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