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Measurement of Stark Halfwidths of Spectral Lines of Ionized Oxygen and Silicon Emitted from T-tube Plasma
| Title: | Measurement of Stark Halfwidths of Spectral Lines of Ionized Oxygen and Silicon Emitted from T-tube Plasma | Authors: | Gavanski, Lazar   |
Issue Date: | 2019 | Publication: | Atoms | ISSN: | 2218-2004 ATOMS Search Idenfier |
Type: | Article | Collation: | vol. 7 br. 1 str. 8-8 | DOI: | 10.3390/atoms7010008 | WoS-ID: | 000464278400002 | Scopus-ID: | 2-s2.0-85066462853 | URI: | https://www.cris.uns.ac.rs/record.jsf?recordId=112907&source=eNauka&language=en https://enauka.gov.rs/handle/123456789/311418 |
Metadata source: | Migracija | M-category: | Mp. category will be shown later |
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