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Nova metoda za ispitivanje nestabilnosti usled naponsko temperaturnih naprezanja VDMOS tranzistora snage
| Title: | Nova metoda za ispitivanje nestabilnosti usled naponsko temperaturnih naprezanja VDMOS tranzistora snage | Authors: | Danković, Danijel   ; Prijić, Aneta ; Manić, Ivica ; Vračar, Ljubomir M. ; Prijić, Zoran ; Stojadinović, Ninoslav |
Issue Date: | 2012 | Type: | Technical reports | URI: | https://enauka.gov.rs/handle/123456789/350384 | URL: | http://www.elfak.ni.ac.rs/cir/%D0%BD%D0%B0%D1%83%D0%BA%D0%B0/%D0%BF%D1%80%D0%BE%D1%98%D0%B5%D0%BA%D1%82%D0%B8/%D1%82%D0%B5%D1%85%D0%BD%D0%B8%D1%87%D0%BA%D0%B0-%D1%80%D0%B5%D1%88%D0%B5%D1%9A%D0%B0/1260-%D0%BD%D0%BE%D0%B2%D0%B0-%D0%BC%D0%B5%D1%82%D0%BE%D0%B4%D0%B0-%D0%B8%D1%81%D0%BF%D0%B8%D1%82%D0%B8%D0%B2%D0%B0%D1%9A%D0%B0-%D0%BD%D0%B0%D0%BF%D1%80%D0%B5%D0%B7%D0%B0%D1%9A%D0%B0-%D0%B2%D0%B4%D0%BC%D0%BE%D1%81-%D1%82%D1%80%D0%B0%D0%BD%D0%B7%D0%B8%D1%81%D1%82%D0%BE%D1%80%D0%B0-%D1%81%D0%BD%D0%B0%D0%B3%D0%B5 | Metadata source: | Migrirano iz RIS podataka | M-category: | Mp. category will be shown later |
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