Static characteristics of the metal-insulator-semiconductor- insulator-metal (MISIM) structure—II. Low frequency capacitance

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Naziv:	Static characteristics of the metal-insulator-semiconductor- insulator-metal (MISIM) structure—II. Low frequency capacitance
Autori:	Đurić, Zoran G. ; Smiljanić, Miloljub; Tjapkin, D.
Godina:	1975
Publikacija:	Solid-State Electronics
ISSN:	0038-1101 Solid-state Electronics Pretraži identifikator
Izdavač:	Elsevier
Tip rezultata:	Naučni članak
Kolacija:	vol. 18 br. 10 str. 827-831
DOI:	10.1016/0038-1101(75)90002-7
Scopus-ID:	2-s2.0-0016564891
URI:	https://cer.ihtm.bg.ac.rs/handle/123456789/3075 https://enauka.gov.rs/handle/123456789/352859
Projekat:	Republic Counsil of Scientific Research of S.R. Serbia, (Under Contracts No. 620/13).
M-kategorija:	Mp kategorija će biti prikazana naknadno.

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