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Title: Yield analysis of partial defect tolerant bit-plane array
Authors: Ćirić, Vladimir  ; Cvetković, Aleksandar ; Milentijević, Ivan  
Issue Date: 2010
Publication: COMPUTERS & MATHEMATICS WITH APPLICATIONS
ISSN: 0898-1221 Computers and Mathematics with Applications Search Idenfier
Type: Article
Collation: vol. 59 br. 1 str. 98-107
DOI: 10.1016/j.camwa.2009.08.068
WoS-ID: 000274004500011
Scopus-ID: 2-s2.0-73749084287
URI: https://enauka.gov.rs/handle/123456789/399450
Metadata source: Migracija
M-category: 
21aM21a

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