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eNauka >  Results >  X-ray diffraction study of Cu-25[AsSe1.4I0.2](75) amorphous semiconductor
Title: X-ray diffraction study of Cu-25[AsSe1.4I0.2](75) amorphous semiconductor
Authors: Bordas, A; Vučinić-Vasić, Milica  ; Kapor, Agneš; Antić, Bratislav  
Issue Date: 2001
Publication: Materials Science Forum
ISSN: 0255-5476 Materials Science Forum Search Idenfier
Publisher: Trans Tech Publications Ltd
Type: Article
ISBN: 0-87849-886-9 Search Idenfier
Collation: vol. 378-381 str. 394-401
DOI: 10.4028/www.scientific.net/MSF.378-381.394
WoS-ID: 000172514200063
URI: https://enauka.gov.rs/handle/123456789/470310
https://vinar.vin.bg.ac.rs/handle/123456789/6324
Note: Verifikacija rada izvršena na osnovu nepotpunog uvida u rad.
Availability note: Пуни текст није јавно доступан
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