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| Title: | Virtual instrumentation software applied to integrated circuit testing procedure | Authors: | Dimitrijević, Božidar  ; Simić, Milan  |
Issue Date: | 2010 | Publication: | 2010 27th International Conference on Microelectronics Proceedings | Type: | Conference Paper | DOI: | 10.1109/miel.2010.5490465 | Scopus-ID: | 2-s2.0-77955194582 | URI: | https://enauka.gov.rs/handle/123456789/509238 | Metadata source: | Migrirano iz RIS podataka | M-category: | Mp. category will be shown later |
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