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Title: Near-field scanning of stochastic fields considering reduction of complexity
Authors: Thomas, David W. P.; Baharuddin, Mohd H.; Smartt, Christopher; Gradoni, Gabriele; Tanner, Gregor; Creagh, Stephen; Dončov, Nebojša  ; Haider, Michael; Russer, Johannes A.
Issue Date: 2017
Publication: 2017 International Symposium on Electromagnetic Compatibility - EMC EUROPE
Type: Conference Paper
DOI: 10.1109/emceurope.2017.8094766
WoS-ID: 000426452800152
Scopus-ID: 2-s2.0-85040627661
URI: https://enauka.gov.rs/handle/123456789/534086
Metadata source: Migrirano iz RIS podataka
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