Physico-Chemical Processes Induced by Electrical Breakdown and Discharge Responsible for Memory Effect in Krypton with &lt; 10 ppm Nitrogen

M. Pejović; M. Pejović; K. Stanković

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Title:	Physico-Chemical Processes Induced by Electrical Breakdown and Discharge Responsible for Memory Effect in Krypton with < 10 ppm Nitrogen
Authors:	M. Pejović; M. Pejović; K. Stanković
Issue Date:	2018
Publication:	PLASMA CHEMISTRY AND PLASMA PROCESSING
ISSN:	0272-4324 Plasma Chemistry and Plasma Processing Search Idenfier
Type:	Article
Collation:	vol. 38 br. 2 str. 415-428
URI:	http://zaposleni.etf.bg.ac.rs/rest/sciNaucniRezultati/oai/record/2/707233 https://enauka.gov.rs/handle/123456789/735166
M-category:	21M21

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