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eNauka >  Results >  Statistical Methods for Detecting Recycled Electronics: From ICs to PCBs and Beyond
Title: Statistical Methods for Detecting Recycled Electronics: From ICs to PCBs and Beyond
Authors: K. Huang; L. Yu; N. Korolija  ; J. Carulli; Y. Makris
Issue Date: 2023
Publication: IEEE Design and Test
ISSN: 2168-2356 IEEE design and test Search Idenfier
Type: Article
Collation: str. 1-1
DOI: 10.1109/MDAT.2023.3283349
WoS-ID: 001168621300006
Scopus-ID: 2-s2.0-85161519241
URI: https://enauka.gov.rs/handle/123456789/762327
http://zaposleni.etf.bg.ac.rs/rest/sciNaucniRezultati/oai/record/2/709113
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