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Spectroscopic ellipsometry and polarimetry for materials and systems analysis at the nanometer scale: state-of-the-art, potential, and perspectives
| Title: | Spectroscopic ellipsometry and polarimetry for materials and systems analysis at the nanometer scale: state-of-the-art, potential, and perspectives | Authors : | Losurdo, Maria; ...; Dohčević-Mitrović, Zorana |
Issue Date: | 2009 | Publication: | JOURNAL OF NANOPARTICLE RESEARCH | ISSN: | 1388-0764 Journal of Nanoparticle Research Search Idenfier |
Type: | Article | Collation: | vol. 11 br. 7 str. 1521-1554 | DOI: | 10.1007/s11051-009-9662-6 | WoS-ID: | 000270543100001 | Scopus-ID: | 2-s2.0-70349756806 | PMID: | 21170135 | PMCID: | PMC2988221 | URI: | https://enauka.gov.rs/handle/123456789/796796 | Metadata source: | (Preuzeto iz Nasi u WoS) | M-category: | 21aM21a |
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