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| Title: | Diagnostics of GaAsHEMT based on noise measurements | Authors: | Jevtic, Milan M; Hadzi-Vukovic, Jovan M | Issue Date: | 2007 | Publication: | JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS | ISSN: | 1454-4164 Journal of Optoelectronics and Advanced Materials Search Idenfier |
Type: | Article | Collation: | vol. 9 br. 11 str. 3579-3584 | WoS-ID: | 000251435200060 | URI: | https://enauka.gov.rs/handle/123456789/798787 | Metadata source: | (Preuzeto iz Nasi u WoS) | M-category: | 22M22 |
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