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Title: Radiation sensitive MOSFETs irradiated with various positive gate biases
Authors: Ristić, Goran S.  ; Ilić, Stefan D.  ; Duane, Russell; Anđelković, Marko S.; Palma, Alberto J; Lallena, Antonio M; Krstić, Miloš D.; Stanković, Srboljub J.  ; Jakšić, Aleksandar B.
Issue Date: 2021
Publication: Journal of Radiation Research and Applied Sciences
ISSN: 1687-8507 Journal of Radiation Research and Applied Sciences Search Idenfier
Type: Article
Collation: vol. 14 br. 1 str. 353-357
DOI: 10.1080/16878507.2021.1970921
WoS-ID: 000693285300001
URI: https://enauka.gov.rs/handle/123456789/805661
https://vinar.vin.bg.ac.rs/handle/123456789/12128
Project: European Union's Horizon 2020 research and innovation programme [857558]
Ministry of Education, Science and Technological Development, Serbia [43011]
Metadata source: (Preuzeto iz Nasi u WoS)
M-category: 
21M21

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