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eNauka >  Rezultati >  GaN HEMT Modeling versus Bias Point and Gate Width
Naziv: GaN HEMT Modeling versus Bias Point and Gate Width
Autori: Crupi, Giovanni; Latino, Mariangela; Gugliandolo, Giovanni; Marinkovic, Zlatica D  ; Cai, Jialin; Fazio, Enza; Donato, Nicola
Godina: 2023
Publikacija: 2023 58TH INTERNATIONAL SCIENTIFIC CONFERENCE ON INFORMATION, COMMUNICATION AND ENERGY SYSTEMS AND TECHNOLOGIES, ICEST
Tip rezultata: Konferencijski rad
Kolacija: str. 211-214
DOI: 10.1109/ICEST58410.2023.10187364
WoS-ID: 001042213500044
Scopus-ID: 2-s2.0-85167868017
URI: https://enauka.gov.rs/handle/123456789/808007
Projekat: GaN4AP (GaN for Advanced Power Applications) project [CUP: B82C21001520008]
Ministry of Science, Technological Development and Innovations of the Republic of Serbia
Izvor metapodataka: (Preuzeto iz Nasi u WoS)
M-kategorija: 
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