Low frequency noise as a tool to study optocouplers with phototransistors

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Naziv:	Low frequency noise as a tool to study optocouplers with phototransistors
Autori:	Jevtic, Milan M
Godina:	2004
Publikacija:	MICROELECTRONICS RELIABILITY
ISSN:	0026-2714 Microelectronics Reliability Pretraži identifikator
Tip rezultata:	Naučni članak
Kolacija:	vol. 44 br. 7 str. 1123-1129
DOI:	10.1016/j.microrel.2004.04.004
WoS-ID:	000222675900014
Scopus-ID:	2-s2.0-2942755770
URI:	https://enauka.gov.rs/handle/123456789/812609
Izvor metapodataka:	(Preuzeto iz Nasi u WoS)
M-kategorija:	22M22 - Međunarodni časopis kategorije M22

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