Results
| Title: | Negative bias temperature instability in n-channel power VDMOSFETs | Authors: | Danković, Danijel   ; Manić, Ivica ; Davidović, Vojkan ; Đorić Veljković, Snežana ; Golubović, Snežana ; Stojadinović, Ninoslav |
Issue Date: | 2008 | Publication: | Microelectronics Reliability | ISSN: | 0026-2714 Microelectronics Reliability Search Idenfier |
Publisher: | United Kingdom : Elsevier Ltd. | Type: | Article | Collation: | vol. 48 br. 8-9 str. 1313-1317 | DOI: | 10.1016/j.microrel.2008.06.015 | WoS-ID: | 000260347000042 | Scopus-ID: | 2-s2.0-50349083101 | URI: | https://enauka.gov.rs/handle/123456789/814753 | Metadata source: | (Preuzeto iz Nasi u WoS) | M-category: | 22M22 |
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